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Statistical Analysis of the Fatigue Life Distribution of Monolithic Silicon Nitride
Author(s) -
Ogasawara Toshio,
Hirosaki Naoto,
Akimune Yoshio
Publication year - 1994
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1994.tb07023.x
Subject(s) - diagram , silicon nitride , ceramic , bimorph , materials science , piezoelectricity , nitride , composite material , stress (linguistics) , statistical analysis , silicon , metallurgy , mathematics , statistics , linguistics , philosophy , layer (electronics)
Cyclic fatigue testing of silicon nitride ceramics was performed at a frequency of f = 150 Hz and a stress ratio of R = 0.1 using a piezoelectric bimorph fatigue device. Based on the method proposed by Fett and Munz, a fatigue crack growth diagram ( K 1 – V diagram) was estimated from fatigue lifetime distribution data. A change in the slope of the K I – V diagram was observed. A statistical analysis for predicting the lifetime of ceramics exhibiting a transition in a K I – V diagram was devised on the basis of this observation. Analytical results obtained with this method showed good agreement with experimental data.