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Stability and Surface Energies of Wetted Grain Boundaries in Aluminum Oxide
Author(s) -
Kim DohYeon,
Wiederhorn Sheldon M.,
Hockey Bernard J.,
Handwerker Carol A.,
Blendell John E.
Publication year - 1994
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1994.tb07013.x
Subject(s) - misorientation , materials science , grain boundary , surface energy , sapphire , dislocation , crystallography , aluminium , oxide , crystal (programming language) , condensed matter physics , chemical physics , composite material , microstructure , metallurgy , optics , chemistry , laser , physics , computer science , programming language
The stability of a calcium‐aluminum‐silicate liquid film between two near‐basal plane surfaces of sapphire at 1650°C was studied. Samples were prepared having an average basal misorientation across the interface of 6–7° about < 〈10 1 0〉. The interfaces varied in orientation from 0° to ∼38° to the [0001] direction. Three types of interfaces were observed: faceted, solid‐liquid interfaces; low‐angle grain boundaries consisting of aligned arrays of dislocations; and boundaries consisting of alternating regions of dislocations and faceted solid‐liquid interfaces. The type of interface observed depended on the orientation of the interface and could be predicted by using a construction based on Wulff shapes. Because the type of interface depends on crystal alignment and interface angle, these results suggest an absolute method of determining the surface free energy of wetted boundaries.