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Raman Spectrometric Determination of the Oxygen Self‐Diffusion Coefficients in Oxides
Author(s) -
Kim ByungKook,
Park Soon Ja,
Hamaguchi Hiroo
Publication year - 1994
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1994.tb04656.x
Subject(s) - raman spectroscopy , analytical chemistry (journal) , chemistry , atmospheric temperature range , tetragonal crystal system , oxygen , diffusion , crystallography , crystal structure , chromatography , physics , organic chemistry , meteorology , optics , thermodynamics
New methods of determining the oxygen self‐diffusion coefficients (D* o ) in oxides have been developed using Raman spectroscopy combined with the 16 O– 18 O exchange technique. From the depth‐profiles of the 18 O concentration in the 16 O– 18 O exchanged oxides, which was measured by Raman microscope with a spatial resolution of 5 μm, D * o was determined for 2.8 mol% Y 2 O 3 ‐containing tetragonal zirconia polycrystall (the depth‐profile method). Thus‐obtained results are expressed as D * O,D‐P = 1.82( +0.41 −0.40 ) × 10 −1 ·exp{−(139.3 ± 0.2) [kJ/mol]/ RT } [cm 2 /s] in the temperature range of 700–950 ° C. We also determined D * o for the same sample from the Raman spectrometric monitoring of the ambient gas during the 16 O– 18 O exchange reaction (the gas‐monitoring method). Thus‐obtained results are expressed as D * O,G‐M = 1.14( +0.05 −0.04 ) × 10 −2 exp{−(117.5 ± 0.4) [kJ/mol]/ RT } [cm 2 /s] in the temperature range of 700–1165°C. The results obtained from the above two different methods virtually agree with each other, indicating that reliable D * o can be obtained by either of these two methods. We demonstrate that Raman spectroscopy is a useful tool for determining D * o in oxides.