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Dielectric Properties of (Pb 1– x X x ) (Zr 0.7 Ti 0.3 )O 3 (X = Ca, Sr, Ba) Ceramics
Author(s) -
Kanai Hideyuki,
Furukawa Osamu,
Abe Hidekazu,
Yamashita Yohachi
Publication year - 1994
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1994.tb04652.x
Subject(s) - dielectric , materials science , hysteresis , ferroelectricity , dielectric loss , ceramic , capacitor , electric field , ferroelectric ceramics , dissipation factor , polarization (electrochemistry) , analytical chemistry (journal) , mineralogy , condensed matter physics , composite material , voltage , optoelectronics , chemistry , electrical engineering , chromatography , physics , engineering , quantum mechanics
The dielectric properties of (Pb 1– x X x ) (Zr 0.7 Ti 0.3 )O 3 (X = Ca, Sr, Ba) ceramics (abbreviated PXZT) were investigated for applications to multilayer ceramic capacitors (MLCs) with dielectric layers thinner than 10 μm. The dissipation factors for MLCs with 5‐μm‐thick dielectric layers were estimated from those for 100‐μm‐thick disk specimens measured at an oscillation voltage of 20 V rms . Those for PCZT and PSZT were less than 1.0% when the oscillation voltage was 20 V rms , while those for conventional BaTiO 3 ‐based dielectric ceramics were greater than 2.5% at 20 V rms . According to polarization–electric field hysteresis measurements, PCZT and PSZT revealed linear and double hysteresis loops, respectively, while PBZT and BaTiO 3 indicated typical ferroelectric hysteresis loops. The differences in the dissipation factors for the dielectric compositions are attributed to hysteresis in the polarization–electric field loops. These results suggest that PCZT and PSZT are promising dielectric ceramics for MLCs with dielectric layers thinner than 10 μm.