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Solid Solubility of Aluminum in O'‐SiAlON
Author(s) -
Ohashi Masayoshi,
Hirao Kiyoshi,
Brito Manuel E.,
Takaaki Nagaoka,
Yasuoka Masaki,
Kanzaki Shuzo
Publication year - 1993
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1993.tb08343.x
Subject(s) - sialon , scanning electron microscope , transmission electron microscopy , aluminium , materials science , solubility , analytical chemistry (journal) , solid solution , energy dispersive x ray spectroscopy , crystallography , spectroscopy , mineralogy , chemistry , metallurgy , nanotechnology , composite material , ceramic , physics , quantum mechanics , chromatography
Energy ‐dispersive X‐ray spectroscopy(EDXS) analysis was used to investigate the solid solubility of aluminum ( X value) in O ‐SiAlONs (Si 2‐x Al x O 1+x N 2‐x )using transmission electron microscopy in the scanning transmission electron microscopy mode. Lattice parameter a of the O ‐SiAlONs increased with increased X value =0.16. The X value of 0.16 was the maximum of the X value in SiAlONs precipitated from a Si‐Al O‐N melt which was sasturated with aluminum and nitrogen at 1700 o C.The X value of O ‐SiAlONs measured by EDXS were smaller than those calculated on the assumption that the Si 2 N 2 O structure accommodated the total amount of the doped Al 2 O 3 . This result suggested that a considerable amount of Al 2 O 3 remained in grain boundaries as secondary phases.