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Crystallization and Properties of a Si‐Y‐Al‐O‐N Glass‐Ceramic
Author(s) -
Besson JeanLouis,
Billieres Dominique,
Rouxel Tanguy,
Goursat Paul,
Flynn Robert,
Hampshire Stuart
Publication year - 1993
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1993.tb08340.x
Subject(s) - materials science , crystallization , thermal expansion , ceramic , electrical resistivity and conductivity , silicon nitride , mineralogy , phase (matter) , yttria stabilized zirconia , creep , glass ceramic , atmospheric temperature range , nitride , composite material , chemical engineering , silicon , metallurgy , thermodynamics , chemistry , cubic zirconia , physics , electrical engineering , organic chemistry , layer (electronics) , engineering
Glasses have been prepared in the Si ‐Y‐Al O‐N system by melting mixtures of silica, alumina, yttria, and silicon nitride. One particular glass containing 17 equiv% N has been investigated to Observe the crystallization at temperatures in the range 1050 o ‐1300 o C. The major crystalline phase observed is Y 2 Si 2 O 7 , existing as the α form below 1200 o C and the β form above this temperature. Properties of the glass‐ceramic, including thermal expansion coefficient, hardness, electrical resistivity, and creep have been assessed.