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A Transmission Electron Microscopy Diffraction and Simulation Method for Early‐Stage Studies of the Evolution of Gel‐Derived Zirconia Precursors
Author(s) -
Tong Jianzhu,
Zuo Jian Min,
Eyring LeRoy
Publication year - 1993
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1993.tb05306.x
Subject(s) - diffraction , transmission electron microscopy , cubic zirconia , electron diffraction , materials science , reflection high energy electron diffraction , electron backscatter diffraction , powder diffraction , x ray crystallography , selected area diffraction , crystallography , optics , chemistry , nanotechnology , physics , composite material , ceramic
A technique, utilizing transmission electron microscopy, is described that enables the modeling and diffraction simulation of structural development during the processing of gelderived products. This technique relies on the determination of the position and relative intensity of diffuse electron diffraction rings from small domains. X‐ray diffraction cannot provide a basis for this analysis. A qualitative microcrystal modeling of the structural changes accompanying the in situ transformation of a zirconia‐precursor gel to crystalline ZrO 2 is described. A quantitative analysis is possible only after correction for the inelastic diffraction effect and a calibration of the nonlinear response of the photographic film.