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Effects of Mechanical Treatment on X‐ray Diffraction Line Broadening in Pyrophyllite
Author(s) -
SánchezSoto Pedro J.,
Macías Manuel,
PérezRodríguez José L.
Publication year - 1993
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1993.tb03704.x
Subject(s) - pyrophyllite , crystallite , grinding , materials science , amorphous solid , diffraction , x ray crystallography , grain size , lattice constant , mineralogy , anisotropy , composite material , condensed matter physics , crystallography , chemistry , optics , metallurgy , physics
When pyrophyllite was subjected to mechanical treatment by dry grinding, the alteration was greater along the c axis of its structure because reflections from basal planes (00 l ) disappeared well before those from nonbasal planes, producing anisotropic X‐ray line broadening observed on grinding. X‐ray analysis showed that the mean lattice microstrains increase and crystallite size decreases along the 00 l direction, as grinding time increases. An inverse relationship between both parameters was found, and interpreted assuming that the number of grain boundaries of the small crystallites increases substantially through mechanical treatment. The maximum surface area of ground samples was reached after 30 min of grinding, with marked line broadening, mean crystallite size of ∼15 nm, and lattice microstrains 0.68. Reactive ground material aggregates, becoming amorphous to X‐rays, and surface area decreases markedly.