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Convergent Beam Electron Diffraction Analysis of Lattice Shifts in Aluminum Nitride
Author(s) -
Callahan Daniel L.,
Thomas Gareth
Publication year - 1992
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1992.tb05543.x
Subject(s) - lattice constant , electron diffraction , impurity , nitride , materials science , crystallite , diffraction , lattice (music) , aluminium , planar , cathode ray , oxygen , condensed matter physics , hexagonal lattice , gallium nitride , crystal structure , electron , crystallography , chemistry , optics , nanotechnology , metallurgy , physics , computer graphics (images) , organic chemistry , layer (electronics) , quantum mechanics , antiferromagnetism , computer science , acoustics
Changes in lattice parameter in high‐purity polycrystalline (2H δ ) aluminum nitride due to oxygen contamination have been examined by convergent beam electron diffraction. The operative lattice distortion was determined by computer simulation to be a continuous increase in c/a ratio commensurate with constant volume as impurity concentration increases and a fine break in hexagonal symmetry. These results are consistent with the distortions associated with planar polytypoid structures at higher oxygen levels.