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X‐RAY DETERMINATION OF THE STRUCTURE OF GLASS *
Author(s) -
Warren B. E.
Publication year - 1992
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1992.tb05432.x
Subject(s) - amorphous solid , tetrahedron , crystallography , diffraction , orientation (vector space) , silicon , materials science , x ray crystallography , x ray , coordination number , chemistry , optics , physics , geometry , mathematics , ion , metallurgy , organic chemistry
ABSTRACT A method has been developed for analyzing the X‐ray diffraction patterns of amorphous solids, and the atomic arrangement in two simple glasses has been completely worked out. In SiO 2 , for example, each silicon is tetrahedrally surrounded by 4 oxygens at a distance 1.60 Å, and each oxygen is shared between two such tetrahedral groups. The mutual orientation of the two groups about their common direction of bonding is random, and hence it is a random three‐dimensional network which is built up. The configuration does not repeat at regular intervals and hence is noncrystalline; it is this feature which distinguishes the glassy state from the crystalline.