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Modification of Surface Texture by Grinding and Polishing Lead Zirconate Titanate Ceramics
Author(s) -
Cheng Si,
Lloyd Isabel K.,
Kahn Manfred
Publication year - 1992
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1992.tb04499.x
Subject(s) - polishing , poling , materials science , grinding , lead zirconate titanate , ceramic , diamond , composite material , intensity (physics) , bismuth titanate , zirconate , surface roughness , ferroelectricity , titanate , optics , optoelectronics , dielectric , physics
Grinding and polishing affected the orientation of 90° domains at the surface of lead zirconate titanate (PZT) ceramics. This was quantified by using changes in the intensity ratio of the {002} and {200} X‐ray reflections. Grinding unpoled PZT with 600‐grit SiC paper gave X‐ray intensity ratios similar to those of poled material. This implies that 90° domain realignments had occurred in the near surface region probed by the X‐rays. Grinding poled samples with 600‐grit SiC further increased the X‐ray intensity ratio beyond that caused by poling, indicating that additional surface reorientation of 90° domains had occurred. The effects of diamond polishing depended on the size of the diamond particles. The use of 6‐μm diamond had no effect on the {002}/{200} intensity ratio of either poled or unpoled samples, while polishing with 15‐ or 45‐μm diamond significantly enhanced the 90° domain rotation. In unpoled samples, the increase in the X‐ray intensity ratio then approached that induced by poling or grinding with 600‐grit SiC paper. While the observed increase in X‐ray intensity ratio upon grinding is attributed to the rotation of 90° domains, the simultaneous formation of 180° domains appears to minimize or reduce the increase in electrical polarization.