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Barrier Layer Capacitor Using Barium Bismuth Plumbate and Barium Plumbate
Author(s) -
Hiremath Basavaraj V.,
Newnham Robert E.,
Cross Leslie E.
Publication year - 1992
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1992.tb04370.x
Subject(s) - capacitor , bismuth , dielectric , barium , materials science , capacitance , ceramic capacitor , dispersion (optics) , barrier layer , high κ dielectric , ceramic , layer (electronics) , optoelectronics , barium titanate , composite material , optics , electrical engineering , chemistry , physics , electrode , metallurgy , engineering , voltage
A new type of barrier layer capacitor is described utilizing thin glass layers on highly conducting ceramics of barium plumbate and barium bismuth plumbate. The frequency dispersion of the apparent dielectric constant has been explained using a modified version of the Maxwell–Wagner model. These capacitors have a low temperature coefficient of capacitance and a high dispersion frequency in the megahertz range. Simple processing conditions together with low firing temperature make it possible to produce the barrier layer capacitors inexpensively.