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In‐Situ Measurement of the Stress‐Induced Phase Transformations in Magnesia‐Partially‐Stabilized Zirconia Using Raman Spectroscopy
Author(s) -
Lim Cheryl S.,
Finlayson Trevor R.,
Ninio Fred,
Griffiths John R.
Publication year - 1992
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1992.tb04227.x
Subject(s) - monoclinic crystal system , raman spectroscopy , materials science , tetragonal crystal system , orthorhombic crystal system , cubic zirconia , phase (matter) , creep , stress (linguistics) , in situ , spectroscopy , crystallography , analytical chemistry (journal) , mineralogy , composite material , crystal structure , chemistry , ceramic , optics , chromatography , quantum mechanics , linguistics , physics , philosophy , organic chemistry
Raman spectroscopy has been used to examine the connection between room‐temperature creep and stress‐induced phase transformations in TS‐Grade Mg‐PSZ. The in‐situ phase measurements obtained show that the tetragonal phase transforms to both the orthorhombic and monoclinic structures under stress. The effect of precipitate orientation is indicated by the variation of creep strain with monoclinic volume fraction.