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Interaction of Chemically Vapor Deposited YBa 2 Cu 3 O x with Yttria‐Stabilized Zirconia Substrates
Author(s) -
Shapiro M. J.,
More Karren L.,
Lackey W. J.,
Hanigofsky John A.,
Hill D. Norman,
Carter W. B.,
Barefield E. K.,
Judson Elizabeth A.,
O'Brien D. F.,
Patrick R.,
Chung Y. S.,
Moss T. S.
Publication year - 1991
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1991.tb07828.x
Subject(s) - cubic zirconia , yttria stabilized zirconia , materials science , zirconium , transmission electron microscopy , chemical vapor deposition , layer (electronics) , scanning electron microscope , mineralogy , chemical engineering , analytical chemistry (journal) , crystallography , ceramic , composite material , nanotechnology , chemistry , metallurgy , engineering , chromatography
High‐resolution transmission electron microscopy and optical diffractograms have revealed that chemically vapor deposited films of superconducting YBa 2 Cu 3 O x react to form an interaction layer with single‐crystal yttriastabilized zirconia. The approximately 5 nm thick interlayer was identified as BaZrO 3 . Zirconium was also found to diffuse through the entire YBa 2 Cu 3 O x film.