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Charge‐Up Scanning Electron Microscopy Images of Intergranular Phases in Semiconducting BaTiO 3 Positive Temperature Coefficient of Resistivity Ceramics
Author(s) -
Nemoto Hiroshi
Publication year - 1991
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1991.tb07170.x
Subject(s) - temperature coefficient , scanning electron microscope , electrical resistivity and conductivity , intergranular corrosion , ceramic , materials science , curie temperature , analytical chemistry (journal) , mineralogy , condensed matter physics , chemistry , composite material , microstructure , electrical engineering , physics , chromatography , ferromagnetism , engineering
A charge‐up image was observed in the intergranular phases of semiconducting BaTiO 3 positive temperature coefficient of resistivity (PTCR) ceramics when the ceramic specimens were heated to the Curie temperature in a scanning electron microscope. Experiments showed that this image was caused by intense secondary electron emission localized in the phases. This charge‐up state seemed to be closely related to the PTCR mechanism.