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Benefits of High‐Resolution Electron Microscopy for the Structural Characterization of Mullites
Author(s) -
Epicier Thierry
Publication year - 1991
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1991.tb06769.x
Subject(s) - mullite , electron microscope , chromium , materials science , characterization (materials science) , resolution (logic) , crystallography , electron diffraction , microscopy , lattice (music) , high resolution , doping , nanotechnology , chemistry , diffraction , metallurgy , optics , optoelectronics , physics , ceramic , computer science , geology , remote sensing , artificial intelligence , acoustics
The structure of 3:2 mullites is investigated by high‐resolution electron microscopy. Attention is paid to the identification of isolated defects, i.e., oxygen vacancies in pure 3:2 mullite and chromium interstitials in chromium‐doped mullite. Models for such defects, including lattice reconstruction effects, are analyzed with the help of image simulations.