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Characterization of β‐Silicon Carbide by Silicon‐29 Solid‐State NMR, Transmission Electron Microscopy, and Powder X‐ray Diffraction
Author(s) -
Carduner Keith R.,
Shinozaki Sam S.,
Rokosz Michael J.,
Peters Charles R.,
Whalen Thomas J.
Publication year - 1990
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1990.tb07589.x
Subject(s) - microcrystalline , materials science , silicon carbide , characterization (materials science) , ceramic , transmission electron microscopy , powder diffraction , sintering , silicon , nmr spectra database , analytical chemistry (journal) , crystallography , spectral line , nanotechnology , composite material , metallurgy , chemistry , organic chemistry , physics , astronomy
Increased interest in ceramic materials, particularly for high‐temperature, high‐stress applications, has created the need for rapid and reliable analytical techniques to monitor microcrystalline structure of commercial ceramic powders. A comparative evaluation of commercially available β‐SiC powders is undertaken to analyze the potential of nuclear magnetic resonance (NMR) in the characterization of β‐SiC powder. NMR provides an acceptable, rapid method for characterization of powders both during powder manufacturing as well as for powder analyses priror to sintering studies. The results of transmission electron microscopy and X‐ray diffraction are correlated with the NMR spectra to explain some newly observed features in the NMR spectra of β‐SiC powders and to illustrate the sensitivity of NMR to microcrystalline disorder.