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Characterization of Polyphasic Silicon Carbide Using Surface‐Enhanced Raman and Nuclear Magnetic Resonance Spectroscopy
Author(s) -
Dando Neal R.,
Tadayyoni M. Azar
Publication year - 1990
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1990.tb07583.x
Subject(s) - silicon carbide , raman spectroscopy , characterization (materials science) , materials science , magic angle spinning , nuclear magnetic resonance , ceramic , silicon , spectroscopy , nuclear magnetic resonance spectroscopy , analytical chemistry (journal) , nanotechnology , chemistry , optoelectronics , optics , composite material , physics , quantum mechanics , chromatography
The present report explores the use of cross‐polarization (CP) and single‐pulse magic angle spinning nuclear magnetic resonance (MAS‐NMR) as well as normal and surfaceenhanced Raman spectroscopy (SERS), in concert, for characterizing highly crystalline polymorphic silicon carbide ceramics. The combined use of these techniques provides a wealth of information regarding bulk, near‐surface, and surface speciation. Both Raman and SERS are promising techniques for fracture surface characterization of these systems. The application of CPMAS‐NMR and SERS to the study of ceramics is reported for the first time in this investigation.