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Impurity Distribution in Polycrystalline Aluminum Nitride Ceramics
Author(s) -
Callahan Daniel L.,
Thomas Gareth
Publication year - 1990
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1990.tb05298.x
Subject(s) - impurity , crystallite , materials science , transmission electron microscopy , ceramic , grain boundary , electron diffraction , amorphous solid , diffraction , mineralogy , microstructure , composite material , crystallography , metallurgy , optics , nanotechnology , chemistry , physics , organic chemistry
Convergent‐beam electron diffraction and diffuse darkfield imaging of transmission electron microscopy were used to obtain qualitative information regarding the distribution of impurities in polycrystalline AIN. Impurities are distributed homogeneously within the grains of a given ceramic, but an amorphous grain‐boundary phase on the order of 1 to 2 nm in thickness is observed between the AIN matrix grains.