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Admittance‐Curve‐Fitting Method for Semiconductive Piezoelectric Ceramics
Author(s) -
Tsurumi Takaaki,
Ichihara Takashi,
Asaga Kiyoshi,
Daimon Masaki
Publication year - 1990
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1990.tb05200.x
Subject(s) - admittance , piezoelectricity , ceramic , materials science , dielectric , resonator , curve fitting , composite material , acoustics , electrical impedance , optoelectronics , mathematics , electrical engineering , physics , engineering , statistics
The admittance‐curve‐fitting method is proposed to determine material coefficients of semiconductive piezoelectric ceramics. In this method, the frequency dependence of admittance of a plate resonator is calculated around the resonance frequency, and the piezoelectric, elastic, and dielectric coefficients in the theoretical formula are refined to fit the observed data. The result of a simulation using four types of hypothetical ceramics with different conductivities and electromechanical coupling factors indicates that various constants determined by this method are more accurate than those by the conventional method. The fitting method is applied practically to the PZT ceramics and Bi,K‐doped PZT ceramics which show semiconductivity.