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Indirect Dissolution of Sapphire into Calcia‐Magnesia‐Alumina‐Silica Melts: Electron Microprobe Analysis of the Dissolution Process
Author(s) -
Sandhage Kenneth H.,
Yurek Gregory J.
Publication year - 1990
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1990.tb04270.x
Subject(s) - dissolution , sapphire , electron microprobe , spinel , materials science , mineralogy , aluminium , microprobe , analytical chemistry (journal) , chemical engineering , inorganic chemistry , metallurgy , chemistry , optics , chromatography , laser , physics , engineering
Spinel, MgAl 2 O 4 , has been observed to form on sapphire during sapphire dissolution into CaO‐MgO‐Al 2 O 3 ‐SiO 2 (CMAS) melts at 1450°. and 1550°C. Electron microprobe analysis was used to characterize the sapphire/melt interface for cases in which spinel did (indirect dissolution) or did not (direct dissolution) form on the sapphire during dissolution into CMAS melts. The concentrations of Al 2 O 3 , MgO, CaO, and SiO 2 were determined as a function of position within the spinel reaction product and in the adjacent melt. The rate‐limiting steps for direct and indirect sapphire dissolution into CMAS melts are discussed.