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Density Determination of Thin Coatings by X‐ray Methods
Author(s) -
Kalman Zwi H.,
Johnson Lois A.,
Wachtman John B.
Publication year - 1989
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1989.tb09703.x
Subject(s) - boehmite , materials science , coating , substrate (aquarium) , absorption (acoustics) , thin film , x ray , mass attenuation coefficient , analytical chemistry (journal) , attenuation coefficient , area density , optics , aluminium , composite material , nanotechnology , chemistry , oceanography , physics , chromatography , geology
A method is proposed and demonstrated for measuring the area density of coatings of known chemical composition on poly crystalline‐substrates by means of an X‐ray technique. The method is based on measuring the absorption in the coating by comparing intensities of substrate Bragg reflections from uncoated and coated substrates at varying angles of incidence. From these measurements, in conjunction with beam‐path geometry and the mass absorption coefficient, the coating area density is determined. Densities are determined for coatings of alumina, boehmite, gold, and other materials.