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Low‐Temperature Ionic Conductivity of 9.4‐mol%‐Yttria‐Stabilized Zirconia Single Crystals
Author(s) -
Dios Solier Juan,
PérezJubindo Miguel A.,
DominguezRodriguez Arturo,
Heuer Arthur H.
Publication year - 1989
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1989.tb07688.x
Subject(s) - yttria stabilized zirconia , electrical resistivity and conductivity , ionic conductivity , materials science , conductivity , cubic zirconia , activation energy , oxygen , breakup , ionic bonding , analytical chemistry (journal) , crystallography , chemistry , ion , ceramic , composite material , psychology , organic chemistry , electrode , chromatography , psychoanalysis , electrical engineering , electrolyte , engineering
Direct current and alternating current electrical conductivity measurements are used to determine the activation energies for the formation of oxygen vacancies by breakup of bound defect complexes (0.32 eV) and their migration (0.84 eV) at low temperatures (<600°C) in Y 2 O 3 ‐fully‐stabilized ZrO 2 single crystals. The defect clusters break up between 360° and 450°C.