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Dielectric Properties of Microporous Glass in the Microwave Region
Author(s) -
Yamamoto Joyce K.,
Lanagan Michael T.,
Bhalla Amar S.,
Newnham Robert E.,
Cross L. Eric
Publication year - 1989
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1989.tb06244.x
Subject(s) - microporous material , dielectric , materials science , oxidizing agent , microwave , composite material , mineralogy , angstrom , atmosphere (unit) , thermal treatment , dielectric loss , porous glass , analytical chemistry (journal) , porosity , thermodynamics , chemistry , optoelectronics , physics , organic chemistry , chromatography , quantum mechanics , crystallography
The dielectric properties of a high‐silica microporous glass were determined at 5.5 and 11.4 GHz. Two measurement methods were used to measure these properties, the resonant cavity and resonant post (Hakki–Coleman) techniques. The accuracy of the two measurement techniques was evaluated and the limiting conditions of measurement were determined. The glass, consisting of pore sizes on the order of tens of angstroms, was subjected to thermal treatments in an oxidizing atmosphere at temperatures from 300° to 1100°C, and chemical treatments in 2% and 10% HF for varying amounts of time. Heat treatment of the glass at 800°C produced a minimum dielectric constant of 2.8 and loss of 0.001. The acid treatment had little effect on the dielectric properties.