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Dispersion Methods of Yttria in Silicon Nitride by Comminution
Author(s) -
Zar Linda C.,
Drew Robin A. L.
Publication year - 1989
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1989.tb06162.x
Subject(s) - comminution , sintering , silicon nitride , materials science , ball mill , yttria stabilized zirconia , dispersion (optics) , nitride , metallurgy , attrition , mineralogy , silicon , composite material , ceramic , cubic zirconia , optics , chemistry , medicine , physics , dentistry , layer (electronics)
Sintering additives were incorporated into Si 3 N 4 by attrition and ball milling using both Si 3 N 4 and Al 2 O 3 media. Dispersion of Y 2 O 3 was observed by backscattered electron imaging. Attrition milling for only 15 min using an Si 3 N 4 medium, was equivalent to 24 h of ball milling. Minimal contamination by the Si 3 N 4 was encountered. [Key words: silicon nitride, yttria, comminution, sintering, dispersion.