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Electrochemical Boundary Conditions for Resistance Degradation of Doped Alkaline‐Earth Titanates
Author(s) -
Waser Rainer M.
Publication year - 1989
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1989.tb06067.x
Subject(s) - grain boundary , degradation (telecommunications) , materials science , capacitor , doping , ceramic capacitor , perovskite (structure) , ceramic , dielectric , conductivity , electrochemistry , dielectric spectroscopy , mineralogy , chemical engineering , composite material , optoelectronics , electronic engineering , electrical engineering , chemistry , electrode , voltage , microstructure , engineering
In order to improve the understanding of de‐field‐induced resistance degradation, ceramic capacitors made from perovskite‐type titanates are formally treated as solidelectrolyte cells. Based on the consideration of the interfaces in these cells, the degradation process can be unambiguously deduced from the well‐known defect structure and transport properties of the titanates. Additional information is obtained from in situ impedance analyses and transport calculations as well as from comparisons between the degradation rate in single crystals and ceramics of different grain size. [Key words: capacitors, titanates, grain boundaries, dielectrics, electrical conductivity.]