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Predicting Failure Stress of Silicon Nitride Ceramics Using Microfocus Radiography
Author(s) -
Cotter Daniel J.,
Koenigsberg William D.,
Pasto Arvid E.,
Bowen Leslie J.
Publication year - 1988
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1988.tb07548.x
Subject(s) - silicon nitride , nondestructive testing , materials science , radiography , ceramic , stress (linguistics) , fracture (geology) , composite material , forensic engineering , structural engineering , silicon , metallurgy , medicine , engineering , radiology , linguistics , philosophy
Microfocus projection radiography was used to evaluate nondestructively a large quantity of silicon nitride modulus‐of‐rupture test bars. Quantitative data (size, shape, and location) on major naturally occurring voids in rejected bars were determined from radiographs. Failure stress prediction was attempted using a fracture mechanics model and nondestructive evaluation data and compared to actual failure stress.