Premium
Thickness Dependence of Fracture Stress in Glass Films Coated on Silicon
Author(s) -
Shimbo Masaru
Publication year - 1988
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1988.tb07515.x
Subject(s) - materials science , composite material , fracture (geology) , substrate (aquarium) , silicon , stress (linguistics) , metallurgy , geology , linguistics , oceanography , philosophy
The stress required for spontaneous fracture of glass films on a silicon substrate was found to be proportional to the reciprocal square root of the film thickness. A simple fracture theory, with an assumption of a wedgelike crack shape, explained this relationship well.