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Long‐Term Operation of Positive Temperature Coefficient Resistors
Author(s) -
Smith James W.
Publication year - 1988
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1988.tb05063.x
Subject(s) - partial pressure , volatilisation , temperature coefficient , resistor , oxygen , atmosphere (unit) , grain boundary , materials science , term (time) , degradation (telecommunications) , controlled atmosphere , mineralogy , analytical chemistry (journal) , chemistry , thermodynamics , metallurgy , composite material , environmental chemistry , microstructure , electrical engineering , physics , organic chemistry , quantum mechanics , voltage , engineering
The effect of various atmospheres on the long‐term operation of positive temperature coefficient resistors was studied. In most cases where degradation of properties occurred, the operable mechanism appeared to be volatilization of oxygen from grain boundaries due to reduction of the partial pressure of oxygen in the atmosphere around the sample. The effect of CCl 2 F 2 , however, was much more pronounced and was attributed to a chemical mechanism.