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Kinetics of the Internal Oxidation of (Mg, Fe)O Solid Solutions
Author(s) -
LUECKE WILLIAM,
KOHLSTEDT D.L.
Publication year - 1988
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1988.tb05027.x
Subject(s) - kinetics , rutherford backscattering spectrometry , oxide , layer (electronics) , analytical chemistry (journal) , chemistry , inert , materials science , solid solution , metallurgy , thin film , nanotechnology , chromatography , physics , organic chemistry , quantum mechanics
Single crystals of Mg 1‐ x Fe x O, x = 0.01, have been oxidized in air at temperatures between 1146 and 1389 K to determine the kinetics of the internal oxidation reaction. A two‐phase region composed of MgFe 2 O 4 precipitates in a (Mg, Fe)O matrix grows inward from the surface as the reaction progresses. The thickness of this layer as a function of time has been determined by optical microscopy; the growth kinetics are parabolic. In addition, an external oxide layer of (Mg, Fe)O grows outward from the original surface. The thickness of this external oxide layer as a function of time was determined by following the displacement of inert markers with Rutherford backscattering spectrometry; the kinetics of the growth of this external layer are also parabolic in time. The parabolic reaction rate constant determined for the growth of the external layer accurately predicts that for the growth of the internally oxidized region.