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Anomalous X‐ray Line Broadening Observed in γ‐Fe 2 O 3 Derived from γ‐FeOOH
Author(s) -
NAKAJIMA K.,
HIROTSU Y.,
OKAMOTO S.
Publication year - 1987
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1987.tb05001.x
Subject(s) - spinel , crystallography , octahedron , line (geometry) , reflection (computer programming) , ion , materials science , crystal structure , stacking , x ray crystallography , diffraction , metal , powder diffraction , chemistry , optics , physics , metallurgy , geometry , mathematics , organic chemistry , computer science , programming language
Defect structure of fine‐grained γ‐Fe 2 O 3 powder obtained by dehydroxylation of y‐FeOOH powder has been studied by X‐ray diffraction and high‐resolution electron micrographs. An anomalous X‐ray line broadening was observed in the γ‐Fe 2 O 3 powder. It is found that the X‐ray line breadth is dependent on the crystal structure factors of each reflection line: the reflections from net planes consisting of only metal ions on tetrahedral sites and octahedral sites of spinel structure are much broader than those from net planes including oxygen ions. The anomalous X‐ray line broadening is explained on the basis of stacking faults in the spinel structure.