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Transmission Electron Microscopic Observations of α‐Cristobalite in Fused Silica
Author(s) -
Castano Victor M.,
Takamori Takeshi,
Shafer Merrill W.
Publication year - 1987
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1987.tb04991.x
Subject(s) - cristobalite , transmission electron microscopy , electron diffraction , materials science , electron microscope , silica glass , mineralogy , transmission (telecommunications) , diffraction , electron , crystallography , optics , chemistry , composite material , nanotechnology , physics , nuclear physics , computer science , quartz , telecommunications
Distinct crystalline phases in some commercial fused silicas were shown by transmission electron microscopy. They were identified to be α‐cristobalite by selectedarea electron diffraction. Their origin and the effect on the glass matrix are discussed.