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Glass Properties in the Yttria‐Alumina‐Silica System
Author(s) -
Hyatt M. J.,
Day D. E.
Publication year - 1987
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1987.tb04901.x
Subject(s) - yttria stabilized zirconia , materials science , thermal expansion , dissolution , electrical resistivity and conductivity , indentation hardness , mineralogy , refractive index , composite material , chemical engineering , microstructure , chemistry , ceramic , cubic zirconia , electrical engineering , optoelectronics , engineering
The glass formation region in the yttria‐alumina‐silica system was investigated. Properties of glasses containing 25 to 55 wt% yttria were measured and the effect of the composition was determined. The density, refractive index, thermal‐expansion coefficient, and microhardness increased with increasing yttria content. The dissolution rate in IN HCl increased with increasing yttria content and temperature. These glasses were also found to have high electrical resistivity.