Premium
Dielectric Measurements of Package Materials in an Inhomogeneously Filled Rectangular Waveguide
Author(s) -
Dube D.C.,
Lanagan Michael T.,
Jang SkiJoo
Publication year - 1987
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1987.tb04899.x
Subject(s) - dielectric , materials science , microwave , permittivity , waveguide , dielectric permittivity , optics , composite material , range (aeronautics) , porosity , optoelectronics , telecommunications , physics , computer science
A transmission technique for dielectric measurements in the microwave region is presented. Thin specimens are longitudinally positioned at the center of a rectangular waveguide. Expressions for the real and imaginary parts of the permittivity are considered with different approximations. The suitability of the technique is evaluated for dielectric measurements of packaging materials. Experimental results are presented for Teflon, porous Vycor, and alumina in the X‐band frequency range.