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Grain‐Boundary Effect in Ceria Doped with Trivalent Cations: II, Microstructure and Microanalysis
Author(s) -
GERHARDT R.,
NOWICK A. S.,
MOCHEL M. E.,
DUMLER I.
Publication year - 1986
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1986.tb07465.x
Subject(s) - grain boundary , microstructure , microanalysis , materials science , doping , amorphous solid , mineralogy , silicon , phase (matter) , metallurgy , analytical chemistry (journal) , chemical engineering , crystallography , chemistry , optoelectronics , organic chemistry , chromatography , engineering
Various samples studied for their electrical behavior in the previous paper are here examined in detail by microstructural and microanalytical techniques. While several microstructural features are observed, the presence of “thick boundaries” (an amorphous silica‐rich phase that surrounds grain boundaries and forms a continuous network) appears to be the principal feature responsible for the grain‐boundary effect. Such features are absent from samples prepared with nearly silicon‐free materials, for which the grain‐boundary effect is also virtually absent.