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Interfaces in Oriented Al 2 O 3 ‐ZrO 2 (Y 2 O 3 ) Eutectics
Author(s) -
MAZEROLLES L.,
MICHEL D.,
PORTIER R.
Publication year - 1986
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1986.tb07419.x
Subject(s) - faceting , eutectic system , transmission electron microscopy , materials science , crystallography , cubic zirconia , epitaxy , electron diffraction , high resolution transmission electron microscopy , x ray crystallography , diffraction , mineralogy , microstructure , metallurgy , chemistry , optics , nanotechnology , physics , ceramic , layer (electronics)
Oriented samples of Al 2 O 3 ‐ZrO 2 (Y 2 O 3 ) eutectics consisting of an alumina matrix with zirconia dispersoids were grown by directional solidification. Preferred growth directions and epitaxial relations were determined from X‐ray and electron diffraction analyses. Imaging of interfaces was performed by high‐resolution transmission electron microscopy on oriented platelets. Semicoherent interfaces were observed with faceting along crystallographic planes of both phases.