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Internal Friction, Dielectric Loss, and Ionic Conductivity of Tetragonal ZrO 2 ‐3% Y 2 O 3 (Y‐TZP)
Author(s) -
WELLER M.,
SCHUBERT H.
Publication year - 1986
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1986.tb04795.x
Subject(s) - ionic conductivity , dielectric , enthalpy , yttrium , relaxation (psychology) , activation energy , conductivity , materials science , dielectric loss , ionic bonding , tetragonal crystal system , atmospheric temperature range , analytical chemistry (journal) , ion , chemistry , thermodynamics , crystallography , crystal structure , metallurgy , psychology , social psychology , physics , optoelectronics , organic chemistry , electrode , chromatography , electrolyte , oxide
The defect structure in 3 mol% Y‐TZP was studied by correlated internal friction, dielectric loss, and ionic conductivity experiments. A prominent mechanical and dielectric loss peak occurs in the temperature range between 380 and 550 K that depends on the frequency of measurement. The relaxation parameters were determined as H m = 90 ± 3 kJ·mol −1 , τ ∞ = (1.0 +1.5 −0.6 ) × 10 −14 s for the mechanical relaxation and H d = 84 ± 3 kJ·mol −1 , τ ∞ = (1.6 +1.7 −0.9 ) × 10 –13 s for the dielectric relaxation. The ionic conductivity below 790 K is controlled by an activation enthalpy of H σ = 89 ± 3 kJ·mol −1 ; at higher temperatures H σ = 60 ± 3 kJ·mol –1 . An atomistic model is presented which assumes that oxygen vacancies are trapped by yttrium ions forming anisotropic complexes which—by reorientation—cause anelastic and dielectric relaxation. At higher temperatures (>790 K) these complexes are dissociated, which leads to the reduced activation enthalpy for ionic conductivity.