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Segregation of Mg to the (0001) Surface of Single‐Crystal Alumina: Quantification of AES Results
Author(s) -
Baik Sunggi
Publication year - 1986
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1986.tb04780.x
Subject(s) - auger electron spectroscopy , auger , doping , basal plane , materials science , crystal (programming language) , analytical chemistry (journal) , grain boundary , single crystal , crystallography , chemistry , atomic physics , microstructure , physics , optoelectronics , chromatography , computer science , nuclear physics , programming language
The actual atomic concentration of Mg segregated to the basal plane of MgO‐doped single‐crystal alumina surfaces is calculated using an Auger electron spectroscopy quantification method which takes the backscattering factors and Auger electron escape depth into account. The results suggest that Mg segregates as effectively as Ca to AI 2 O 3 interfaces. Plausible reasons why Mg has not been detected previously in the grain boundaries of MgO‐doped poly crystalline Al 2 O 3 , while Ca has always been found instead, are discussed.