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Study by Extended X‐ray Absorption Fine‐Structure Technique and Microscopy of the Chemical State of Yttrium in α‐Polycrystalline Alumina
Author(s) -
LOUDJANI M.K.,
ROY J.,
HUNTZ A.M.,
CORTES R.
Publication year - 1985
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1985.tb16155.x
Subject(s) - yttrium , crystallite , valence (chemistry) , materials science , doping , analytical chemistry (journal) , crystallography , scanning electron microscope , absorption (acoustics) , aluminium oxides , ion , x ray , mineralogy , chemistry , oxide , metallurgy , optics , biochemistry , catalysis , physics , optoelectronics , chromatography , composite material , organic chemistry
Yttrium‐doped a‐poly crystalline alumina was studied by microscopy observations and by extended X‐ray absorption fine‐structure experiments. The latter results were compared to those obtained for a standard Y 2 O 3 powder and to theoretical spectra for Y 2 O 3 , and Y 3 Al 5 O 12 calculated on the basis of crystallographic data. Most of the yttrium in the doped alumina is precipitated as a Y 3 Al 5 O 12 phase. An observed threshold displacement involves a slight valence electron delocalization for the Y 3+ ion.