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Interpretation of Analyses of Silicate Glasses and Minerals Obtained by Secondary‐Ion Mass Spectrometry
Author(s) -
Lacharme JeanPierre,
Lehuede Patrice
Publication year - 1985
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1985.tb15333.x
Subject(s) - silicate glass , ion , silicate , secondary ion mass spectrometry , mass spectrometry , sputtering , analytical chemistry (journal) , chemistry , materials science , mineralogy , environmental chemistry , nanotechnology , thin film , chromatography , organic chemistry
A commercial floa olass was analyzed by secondary‐ion muss spectrometry. The depth profiles show important variations in the 40Ca + , 24Mg + , und 28Si + ion intensities at the beginning of analyses, even on fresh fracture surfaces. Field‐induced migration of the ions or preferential sputtering cannot account for the observed variations in the secondary‐ion currents.