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Effect of Impurities on Sic Whisker Morphology
Author(s) -
Mazdiyasni K. S.,
Zangvil Avigdor
Publication year - 1985
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1985.tb15220.x
Subject(s) - whiskers , whisker , impurity , materials science , scanning electron microscope , transmission electron microscopy , monocrystalline whisker , organosilicon , mineralogy , alkali metal , scanning transmission electron microscopy , spectrometer , chemical engineering , analytical chemistry (journal) , composite material , optics , nanotechnology , chemistry , chromatography , organic chemistry , physics , engineering , polymer chemistry
Thermal decomposition of polymeric organosilicon, as precursor to Sic whiskers, in the presence of impurities such as alkali and alkaline‐earth metals and aluminum resulted in glass beads or droplets on the β‐Sic whiskers. Semiquantitative analysis of typical whiskers and whiskers with glass beads were performed using a transmission electron microscope equipped with an energy‐dispersive X‐ray spectrometer and a scanning transmission electron microscope equipped with an electron energy loss spectrometer. The major impurities identified were correlated with the processing method employed