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Further Comment on “Direct Observation of Crack‐Tip Geometry of SiO 2 Glass by High‐Resolution Electron Microscopy”
Author(s) -
Macmillan N. H.
Publication year - 1985
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1985.tb11536.x
Subject(s) - high resolution , state (computer science) , engineering physics , library science , art history , history , physics , computer science , archaeology , algorithm