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Defects in Silicon Carbide Whiskers
Author(s) -
NUTT S. R.
Publication year - 1984
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1984.tb19730.x
Subject(s) - whiskers , whisker , monocrystalline whisker , silicon carbide , materials science , transmission electron microscopy , composite material , planar , perpendicular , silicon , area density , carbide , nanotechnology , optoelectronics , geometry , computer graphics (images) , mathematics , computer science
Defects in silicon carbide whiskers made from rice hulls were identified and analyzed using transmission electron microscopy. The whiskers were characterized by a high density of planar faults lying on close‐packed planes perpendicular to the whisker axis. The faulting resulted in complex mixtures of β and α polytypes arranged in thin lamellae normal to the whisker axis. Core regions of whiskers were often filled with small cavities ranging in size from 1 to 20 nm. Partial dislocations accompanied the cavities and were analyzed through specimen tilting experiments.