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Factors Influencing Residual Surface Stresses due to a Stress‐Induced Phase Bansformation
Author(s) -
GREEN DAVID J.,
LANGE F. F.,
JAMES MICHAEL R.
Publication year - 1983
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1983.tb10610.x
Subject(s) - materials science , residual stress , tetragonal crystal system , composite material , phase (matter) , diffraction , grinding , monoclinic crystal system , oxide , grain size , mineralogy , optics , crystallography , metallurgy , crystal structure , geology , chemistry , physics , organic chemistry
An X‐ray diffraction technique was used to measure the residual surface stresses on ground surfaces of Al 2 O 3 /ZrO 2 (tetragonal) composites. To accomplish this, it was necessary to use a radiation for which the penetration depth was small (large wavelength), e.g. CrKα radiation. It was found that these materials could have compressive stresses as high as 1 GPa on their surface, which is a result of the molar volume associated with the tetragonal‐to‐monoclinic ZrO 2 phase transformation. This transformation was induced by the grinding stresses and a reasonable correlation between the amount of ZrO 2 transformed and the magnitude of the residual stresses was established. Evidence was found that the transformation depth is controlled by the amount of stabilizing oxide added to the ZrO 2 and by the ZrO 2 grain size. In the materials studied, transformation depths were found to be typically <20 μm.