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Characterization and Crystallization of Y‐Si‐Al‐O‐N Glass
Author(s) -
Thomas G.,
Ahn C.,
Weiss J.
Publication year - 1982
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1982.tb10793.x
Subject(s) - crystallization , materials science , scanning electron microscope , phase (matter) , microanalysis , electron microscope , analytical chemistry (journal) , optical microscope , atmospheric temperature range , mineralogy , characterization (materials science) , crystallography , chemical engineering , chemistry , composite material , nanotechnology , optics , thermodynamics , chromatography , physics , organic chemistry , engineering
Glasses were prepared from sintered powders ofSi 3 N 4 , Al 2 O 3 , Y 2 O 3 AlN, andSiO 2 to study their crystallization on subsequent heat treatment. Appreciable crystallization was efected only after the glasses were doped with up to 5 wt% ZrO 2 . Electron microscopy and microanalysis showed that the crystalline phase was Y 2 O 3 ·2SiO 2 without detectable Zr. The sofening temperature is in the range 850° to 1020°C. In‐situ heating in a high‐voltage electron microscope at ∼12OO°C produced renucleation and growth of the crystalline phase; at higher temperatures, however, the glass phase volatilized.