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Study of Extended X‐Ray Absorption Fine Structure for Possible Use in Examining Local Atomic Arrangements in Oxides
Author(s) -
TANG C.,
GEORGOPOULOS P.,
COHEN J.B.
Publication year - 1982
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1982.tb09942.x
Subject(s) - extended x ray absorption fine structure , absorption (acoustics) , x ray absorption fine structure , local structure , scattering , surface extended x ray absorption fine structure , oxide , materials science , chemical physics , short range order , solid solution , computational physics , molecular physics , chemistry , optics , crystallography , absorption spectroscopy , physics , spectroscopy , metallurgy , composite material , quantum mechanics
Extended X‐ray absorption fine structure (EXAFS) patterns were simulated on a computer for nonstoichiometric oxides and oxide solid solutions. Within the usual experimental error, it is generally not possible to distinguish between a random array of solute or defects, or local order. Diffuse scattering is a more sensitive tool in many cases.