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Concurrent Flaw Populations in SiC
Author(s) -
Easler T. E.,
Bradt R. C.,
Tressler R. E.
Publication year - 1981
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1981.tb10260.x
Subject(s) - weibull distribution , silicon carbide , materials science , enhanced data rates for gsm evolution , fracture (geology) , composite material , population , carbide , surface (topology) , forensic engineering , statistics , geometry , mathematics , computer science , engineering , telecommunications , demography , sociology
Concurrent surface and edge flaw populations were identified on fracture surfaces of as‐machined specimens of sintered silicon carbide. The overall strength distribution and the individual concurrent distributions were estimated using Weibull statistics. Design implications of using a single flaw population and the difficulties associated with rigorously separating the concurrent distributions are discussed.