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Influence of Microcracking and Slow Crack Growth on the Planar Coupling Coefficient in PZT
Author(s) -
Chiang S. S.,
Fulrath R. M.,
Pask J. A.
Publication year - 1981
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1981.tb10238.x
Subject(s) - poling , materials science , grain size , planar , composite material , coupling (piping) , grain growth , mineralogy , dielectric , chemistry , ferroelectricity , computer graphics (images) , optoelectronics , computer science
The difference in the planar coupling coefficient, k p , of two PZT specimens with different grain sizes under the same poling treatment was attributed to a greater tendency for microcracking in the large grain‐size specimens. In the absence of microcracking, as shown in small grain‐size specimens, the decrease in k p and failure of the poled specimens is attributed to slow crack growth. The optimum poling conditions for small grain‐size specimens were evaluated in terms of reducing the slow crack‐growth effect.