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Examination of Grain Boundaries of Mn‐Zn Ferrites by AES and TEM
Author(s) -
FRANKEN P. E. C.,
STACY W. T.
Publication year - 1980
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1980.tb10729.x
Subject(s) - grain boundary , materials science , amorphous solid , electrical resistivity and conductivity , phase (matter) , microanalysis , analytical chemistry (journal) , dopant , mineralogy , metallurgy , microstructure , crystallography , chemistry , doping , optoelectronics , organic chemistry , chromatography , electrical engineering , engineering
AES analysis of grain boundaries of Mn‐Zn ferrites, combined with ion etching, shows that CaO and SiO 2 dopants are enriched in a layer of ∼2 nm; TEM showed no separate phase at the grain boundaries. Using TEM combined with X‐ray microanalysis three types of secondary phases, one crystalline and two amorphous, were found at the multiple‐grain junctions. Although the absence of a planar second phase has not been proved, these results argue against the presence of a high‐resistivity glassy layer and support the hypothesis that the high resistivity is caused by segregation of Ca during cooling, causing oxidation of the grain boundaries.