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Transmission Electron Microscopy at Grain Boundaries of PTC‐Type BaTiO 3 Ceramics
Author(s) -
HAANSTRA H. B.,
IHRIG H.
Publication year - 1980
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1980.tb10722.x
Subject(s) - grain boundary , materials science , transmission electron microscopy , ferroelectricity , ceramic , intergranular corrosion , amorphous solid , condensed matter physics , phase (matter) , electron diffraction , mineralogy , crystallography , diffraction , composite material , microstructure , optics , optoelectronics , nanotechnology , chemistry , dielectric , physics , organic chemistry
Transmission electron microscopy of the grain boundaries of Ti‐rich semiconducting PTC‐type BaTiO 3 ceramics is described. At a width of 2 to 10 nm, there were no indications of intergranular second‐phase layers covering the grains. Second phase was segregated only at the contacts of three or more grains; electron diffraction confirmed the amorphous structure of this phase. Observed ferroelectric domains at the grain boundaries do not indicate a PTC‐specific orientation of ferroelectric domains due to the negative grain surface charge.